Authors: Ramina. K
Abstract: Lead sulphide (PbS) thin films have attracted significant research interest because of their narrow band gap, excellent infrared sensitivity, and promising applications in optoelectronic devices, infrared detectors, solar cells, and photoconductive systems. The present study investigates the synthesis and characterization of PbS thin films deposited on glass substrates using the Successive Ionic Layer Adsorption and Reaction (SILAR) technique. The films were prepared under controlled deposition conditions and subsequently subjected to different cooling durations to evaluate their influence on structural and optical characteristics. Structural analysis was performed using X-ray Diffraction (XRD), while surface morphology and optical properties were examined using Scanning Electron Microscopy (SEM) and UV–Visible spectroscopy. XRD analysis confirmed the formation of polycrystalline PbS thin films with a face-centred cubic crystal structure. Variations in grain size, strain, and dislocation density were observed with different cooling durations, indicating that post-deposition treatment significantly affects crystal growth. SEM images revealed uniform surface morphology with densely packed grains, whereas UV–Visible analysis demonstrated favourable optical absorption characteristics suitable for photovoltaic and infrared sensing applications. The findings indicate that the SILAR method is an economical, simple, and effective technique for producing high-quality PbS thin films with potential applications in advanced optoelectronic devices.
